Achieving defect-free multilevel 3D flash memories with one-shot program design

Chien Chung Ho, Yung Chun Li, Yuan Hao Chang, Yu Ming Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

To store the desired data on MLC and TLC flash memories, the conventional programming strategies need to divide a fixed range of threshold voltage (Vt) window into several parts. The narrowly partitioned Vt window in turn limits the design of programming strategy and becomes the main reason to cause flash-memory defects, i.e., the longer read/write latency and worse data reliability. This motivates this work to explore the innovative programming design for solving the flash-memory defects. Thus, to achieve the defect-free 3D NAND flash memory, this paper presents and realizes a one-shot program design to significantly eliminate the negative impacts caused by conventional programming strategies. The proposed one-shot program design includes two strategies, i.e., prophetic and classification programming, for MLC flash memories, and the idea is extended to TLC flash memories. The measurement results show that it can accelerate programming speed by 31x and reduce RBER by 1000x for the MLC flash memory, and it can broaden the available window of threshold voltage up to 5.1x for the TLC flash memory.

Original languageEnglish
Title of host publicationProceedings of the 55th Annual Design Automation Conference, DAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781450357005
DOIs
Publication statusPublished - 2018 Jun 24
Event55th Annual Design Automation Conference, DAC 2018 - San Francisco, United States
Duration: 2018 Jun 242018 Jun 29

Publication series

NameProceedings - Design Automation Conference
VolumePart F137710
ISSN (Print)0738-100X

Conference

Conference55th Annual Design Automation Conference, DAC 2018
Country/TerritoryUnited States
CitySan Francisco
Period18-06-2418-06-29

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation

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