Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin; Dzung Han Tsai; Kuan Jen Wang; Sheng Hui Chen; Kai Lun Chi; Jin Wei Shi; Po Cheng Chen; Jinn Kong Sheu

doi:10.1063/1.4816800

Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

Department of Photonics

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

Original language	English
Article number	072126
Journal	AIP Advances
Volume	3
Issue number	7
DOIs	https://doi.org/10.1063/1.4816800
Publication status	Published - 2013 Jul

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1063/1.4816800

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@article{cc0e2a5936c84a0c8629f185c915a3e0,

title = "Acoustic spectroscopy for studies of vitreous silica up to 740 GHz",

abstract = "Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.",

author = "Lin, {Kung Hsuan} and Tsai, {Dzung Han} and Wang, {Kuan Jen} and Chen, {Sheng Hui} and Chi, {Kai Lun} and Shi, {Jin Wei} and Chen, {Po Cheng} and Sheu, {Jinn Kong}",

note = "Funding Information: The authors would like to thank Wei-Liang Chang for proofreading this manuscript. This work is sponsored by National Science Council of Taiwan under Grant Nos.: NSC100-2112-M-001-028-MY3. ",

year = "2013",

month = jul,

doi = "10.1063/1.4816800",

language = "English",

volume = "3",

journal = "AIP Advances",

issn = "2158-3226",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}

TY - JOUR

T1 - Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

AU - Lin, Kung Hsuan

AU - Tsai, Dzung Han

AU - Wang, Kuan Jen

AU - Chen, Sheng Hui

AU - Chi, Kai Lun

AU - Shi, Jin Wei

AU - Chen, Po Cheng

AU - Sheu, Jinn Kong

N1 - Funding Information: The authors would like to thank Wei-Liang Chang for proofreading this manuscript. This work is sponsored by National Science Council of Taiwan under Grant Nos.: NSC100-2112-M-001-028-MY3.

PY - 2013/7

Y1 - 2013/7

N2 - Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

AB - Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

UR - http://www.scopus.com/inward/record.url?scp=84882447125&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84882447125&partnerID=8YFLogxK

U2 - 10.1063/1.4816800

DO - 10.1063/1.4816800

M3 - Article

AN - SCOPUS:84882447125

VL - 3

JO - AIP Advances

JF - AIP Advances

SN - 2158-3226

IS - 7

M1 - 072126

ER -