Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

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Abstract

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

Original languageEnglish
Article number072126
JournalAIP Advances
Volume3
Issue number7
DOIs
Publication statusPublished - 2013 Aug 26

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Lin, K. H., Tsai, D. H., Wang, K. J., Chen, S. H., Chi, K. L., Shi, J. W., Chen, P. C., & Sheu, J. K. (2013). Acoustic spectroscopy for studies of vitreous silica up to 740 GHz. AIP Advances, 3(7), [072126]. https://doi.org/10.1063/1.4816800