Abstract
Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.
Original language | English |
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Article number | 072126 |
Journal | AIP Advances |
Volume | 3 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2013 Jul |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)