Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin; Dzung Han Tsai; Kuan Jen Wang; Sheng Hui Chen; Kai Lun Chi; Jin Wei Shi; Po Cheng Chen; Jinn Kong Sheu

doi:10.1063/1.4816800

Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

Department of Photonics

Research output: Contribution to journal › Article

7 Citations (Scopus)

Abstract

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.

Original language	English
Article number	072126
Journal	AIP Advances
Volume	3
Issue number	7
DOIs	https://doi.org/10.1063/1.4816800
Publication status	Published - 2013 Aug 26

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All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

Cite this

Lin, K. H., Tsai, D. H., Wang, K. J., Chen, S. H., Chi, K. L., Shi, J. W., Chen, P. C., & Sheu, J. K. (2013). Acoustic spectroscopy for studies of vitreous silica up to 740 GHz. AIP Advances, 3(7), [072126]. https://doi.org/10.1063/1.4816800

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10.1063/1.4816800