Admittance spectroscopy in CZTSSe: Metastability behavior and voltage dependent defect study

Mark J. Koeper, Charles J. Hages, Jian V. Li, Dean Levi, Rakesh Agrawal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Admittance spectroscopy has been performed on a CZTSSe device with a carrier injection pretreatment and under electronically relaxed conditions to demonstrate metastability behavior. We show that the measurements with the carrier injection pretreatment demonstrate two admittance signatures while the relaxed measurement demonstrates only one admittance signature with a different activation energy. Additionally, voltage dependent admittance spectroscopy was performed using the carrier injection pretreatment method at each of the applied voltage bias. The activation energies of the two admittance signatures were calculated and are shown to be independent of the voltage bias.

Original languageEnglish
Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2200-2203
Number of pages4
ISBN (Electronic)9781509027248
DOIs
Publication statusPublished - 2016 Nov 18
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 2016 Jun 52016 Jun 10

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2016-November
ISSN (Print)0160-8371

Other

Other43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
CountryUnited States
CityPortland
Period16-06-0516-06-10

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Koeper, M. J., Hages, C. J., Li, J. V., Levi, D., & Agrawal, R. (2016). Admittance spectroscopy in CZTSSe: Metastability behavior and voltage dependent defect study. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (pp. 2200-2203). [7750025] (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2016-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7750025