@inproceedings{a1f369f755ca4df2b36b2104d091e015,
title = "Admittance spectroscopy in CZTSSe: Metastability behavior and voltage dependent defect study",
abstract = "Admittance spectroscopy has been performed on a CZTSSe device with a carrier injection pretreatment and under electronically relaxed conditions to demonstrate metastability behavior. We show that the measurements with the carrier injection pretreatment demonstrate two admittance signatures while the relaxed measurement demonstrates only one admittance signature with a different activation energy. Additionally, voltage dependent admittance spectroscopy was performed using the carrier injection pretreatment method at each of the applied voltage bias. The activation energies of the two admittance signatures were calculated and are shown to be independent of the voltage bias.",
author = "Koeper, {Mark J.} and Hages, {Charles J.} and Li, {Jian V.} and Dean Levi and Rakesh Agrawal",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",
year = "2017",
doi = "10.1109/PVSC.2017.8366501",
language = "English",
series = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "206--209",
booktitle = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
address = "United States",
}
