Admittance-to-Digital-Impedance Converter for Wide-Frequency-Range Impedance Measurement System

Hao Wei Lin, Chia Ning Su, Tse An Chen, Yi Chen Chen, Mei Jywan Syu, Chia Ling Wei

Research output: Contribution to journalArticlepeer-review


An admittance-to-digital-impedance converter (ADIC) for impedance measurement is proposed. The ADIC was integrated in a chip with a programmable sinusoidal frequency synthesizer, allowing an operating range from 0.1 Hz to 10 kHz. The frequency synthesizer generates sinusoidal voltage signals to a sample under test (SUT), and the resulting current signal from the SUT is sensed and sent to the ADIC for postprocessing. In fact, this sensed signal is proportional to the SUT admittance, rather than to its impedance. Hence, the proposed ADIC has two functions: taking the reciprocal of the sensed signal to make it proportional to impedance and converting it into a digital signal. Furthermore, two novel circuits are also proposed: a low-leakage magnitude detector that makes it possible to measure at sub-1-Hz frequencies and a stepped-pulse divider that performs an accurate dividing function. The chip was fabricated by using a 0.35- mu text{m} 2P4M mixed-signal process. According to the measured results, the maximum errors in the magnitude and phase measurements were 1.6% and 1.8°, respectively, and the proposed system was verified by measuring the concentrations of albumin solutions.

Original languageEnglish
Article number9406039
JournalIEEE Transactions on Instrumentation and Measurement
Publication statusPublished - 2021

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering


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