Advanced Studies of selection schemes between neural-network (NN) and multiple-regression (MR) outputs of a virtual metrology system (VMS) are presented in this paper. Both NN and MR are applicable algorithms for implementing VM conjecture models. But a MR algorithm may achieve better accuracy only with a stable process, whereas a NN algorithm may has superior accuracy when equipment property drift or shift occurs. To take advantage of the merits of both MR and NN algorithms, the simple-selection scheme (SS-scheme) was proposed in CASE 2008 to enhance virtual-metrology (VM) conjecture accuracy. This SS-scheme simply selects either NN or MR output. Recently, with advanced studies, a weighted-selection scheme (WS-scheme), which computes the VM output with a weighted sum of NN and MR results, has been developed. Besides the example with the CVD process of fifth generation TFT-LCD used in the CASE 2008 paper, a new example with the photo process is also adopted in this paper to test and compare the conjecture accuracy among solo NN, solo MR, SS-scheme, and WS-scheme. One-hidden-layered back-propagation neural network (BPNN-I) is adopted for establishing the NN conjecture model. Test results show that the conjecture accuracy of the WS-scheme is the best among those of solo NN, solo MR, SS-scheme, and WS-scheme algorithms.