Aging Impact of Power MOSFETs in Charger with Different Operation Frequency

Kuan Hsun Duh, Cheng Wen Wu, Ming Der Shieh, Chao Hsun Chen, Ming Yan Fan

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The global warming and pollution issues have reached an alarming level that requires immediate actions by all governments in the world to reduce fossil fuel vehicles, and even ban them in the foreseeable future. As a result, electric vehicles (EVs) are gaining ground rapidly. Inside the EVs, especially their power train, semiconductor power devices are considered the key components. Increasing the performance, energy efficiency, and reliability of power MOSFET, therefore, is critical in the EV industry. In this work, we stress the reliability and lifetime of power MOSFET devices and propose an aging model for them. We will show the procedure to construct the efficient aging model for a power MOSFET, supported by circuit-level simulation results. The aging conditions, including high temperature and/or high voltage on the gate oxide, will result in threshold voltage shift, which in turn decreases the MOSFET's switching speed and driving capability. With the proposed aging assessment tool for power MOSFET, the device's performance under different aging conditions can be predicted. The experiment results show that aging will reduces its switching speed and driving power. Experimental results by our tool also show that the circuit efficiency, ripple voltage, switching loss, etc., are negatively affected by aging.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE 31st Asian Test Symposium, ATS 2022
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781665472272
Publication statusPublished - 2022
Event31st IEEE Asian Test Symposium, ATS 2022 - Taichung, Taiwan
Duration: 2022 Nov 212022 Nov 23

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Conference31st IEEE Asian Test Symposium, ATS 2022

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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