AlGaN/GaN two-dimensional electron gas Schottky barrier photodiodes with multiple MgxNy/GaN layers

P. C. Chang, K. H. Lee, S. J. Chang, Y. K. Su, C. H. Liu

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2 Citations (Scopus)

Abstract

In this study, AlGaN/GaN two-dimensional electron gas (2DEG) heterostructures were grown by metal organic chemical vapor deposition (MOCVD). It was found that we could reduce reverse leakage current and provide high-voltage operation by introducing multiple MgxNy/GaN layers into the conventional Schottky barrier photodiodes (SBPD). An atomic force microscopy (AFM) scan image showed that surface pits of TD terminations were hardly observed as the multiple MgxNy/GaN layers were grown before subsequently depositing a high-temperature (HT) AlGaN/GaN epitaxial layer. A larger Schottky barrier height (ΦB) and smaller ideality factor (n) extracted from the current-voltage (I-V) curve for SBPD with multiple MgxNy/GaN layers also suggested that better crystal quality and rectifying properties were achieved. The larger value of ΦB might be explained by the reduction of the TD density and interface state (IS) density.

Original languageEnglish
Article number105005
JournalSemiconductor Science and Technology
Volume24
Issue number10
DOIs
Publication statusPublished - 2009

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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