An 8-bit 400-MS/s calibration-free SAR ADC with a pre-amplifier-only comparator

Chih Huei Hou, Soon-Jyh Chang, Hao Sheng Wu, Huan Jui Hu, En Ze Cun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

A single-channel lb/cycle 8-bit 400-MS/s successive-approximation register (SAR) analog-to-digital converter (ADC) is presented in this paper. The operation speed is enhanced by using the loop-unrolled technique in the coarse conversions. Moreover, we propose a timing control scheme which would shorten the critical timing path to alleviate the speed limitation in the fine conversions. Also, we propose a high-gain dynamic pre-amplifier to realize such a timing control scheme so as to meet our target resolution. The proof-of-concept prototype was fabricated in a TSMC 90-nm CMOS technology. At 1.2-V supply voltage and 400-MS/s sampling rate, the power consumption of the SAR ADC is 3.198 mW. The peak ENOB is 7.15 bits without costly calibration circuit. It achieves a figure of merit (FoM) of 56.29 fJ/conversion-step.

Original languageEnglish
Title of host publication2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509039692
DOIs
Publication statusPublished - 2017 Jun 5
Event2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 - Hsinchu, Taiwan
Duration: 2017 Apr 242017 Apr 27

Publication series

Name2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017

Other

Other2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
CountryTaiwan
CityHsinchu
Period17-04-2417-04-27

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Fingerprint Dive into the research topics of 'An 8-bit 400-MS/s calibration-free SAR ADC with a pre-amplifier-only comparator'. Together they form a unique fingerprint.

Cite this