An application-independent delay testing methodology for Island-style FPGA

Yen Lin Peng, Jing Jia Liou, Chih Tsun Huang, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

A novel fault model for detecting delay defects of FPGAs is proposed in this paper. Our fault model assumes that a target segment can be covered by a shortest path which is realizable in an FPGA. And the path will guarantee to detect delay defects which affect the performance of the segment. Given the proposed fault model, we also developed a framework to search for the target paths and find appropriate tests, which is independent to the size of FPGAs. Several methods are also proposed to minimize the number of test configurations (the test time). The tests can achieve a high coverage of delay defects with reasonable test time.

Original languageEnglish
Title of host publicationProceedings - 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
EditorsR. Aitken, A. Salsano, R. Velazco, X. Sun
Pages478-486
Number of pages9
DOIs
Publication statusPublished - 2004 Dec 1
Event19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Cannes, France
Duration: 2004 Oct 102004 Oct 13

Publication series

NameIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Conference

Conference19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
CountryFrance
CityCannes
Period04-10-1004-10-13

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Peng, Y. L., Liou, J. J., Huang, C. T., & Wu, C. W. (2004). An application-independent delay testing methodology for Island-style FPGA. In R. Aitken, A. Salsano, R. Velazco, & X. Sun (Eds.), Proceedings - 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (pp. 478-486). (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems). https://doi.org/10.1109/DFTVS.2004.1347873