An approach for measuring the ellipsometric parameters of isotropic and anisotropic thin films using the stokes parameter method

Yu Lung Lo, Wen Hsiang Hsieh, Yi Fan Chung, Shiou An Tsai

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'An approach for measuring the ellipsometric parameters of isotropic and anisotropic thin films using the stokes parameter method'. Together they form a unique fingerprint.

Physics & Astronomy