Abstract
In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short lest time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.
| Original language | English |
|---|---|
| Pages (from-to) | 512-514 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
| Volume | 10 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2002 Aug 1 |
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All Science Journal Classification (ASJC) codes
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
}
An efficient BIST method for distributed small buffers. / Jone, W. B.; Huang, D. C.; Wu, S. C.; Lee, Kuen-Jong.
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 10, No. 4, 01.08.2002, p. 512-514.Research output: Contribution to journal › Article
TY - JOUR
T1 - An efficient BIST method for distributed small buffers
AU - Jone, W. B.
AU - Huang, D. C.
AU - Wu, S. C.
AU - Lee, Kuen-Jong
PY - 2002/8/1
Y1 - 2002/8/1
N2 - In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short lest time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.
AB - In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short lest time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.
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UR - http://www.scopus.com/inward/citedby.url?scp=0036705046&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2002.800532
DO - 10.1109/TVLSI.2002.800532
M3 - Article
VL - 10
SP - 512
EP - 514
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
SN - 1063-8210
IS - 4
ER -