In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short lest time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.
|Number of pages||3|
|Journal||IEEE Transactions on Very Large Scale Integration (VLSI) Systems|
|Publication status||Published - 2002 Aug 1|
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering