An efficient BIST method for distributed small buffers

W. B. Jone, D. C. Huang, S. C. Wu, K. J. Lee

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short lest time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.

Original languageEnglish
Pages (from-to)512-514
Number of pages3
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume10
Issue number4
DOIs
Publication statusPublished - 2002 Aug 1

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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