An efficient diagnosis-aware pattern generation procedure for transition faults

Kuen Jong Lee, Cheng Hung Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents an efficient transition-fault diagnosis pattern generation procedure to identify equivalent-fault pairs and generate diagnosis patterns for nonequivalent-fault pairs. Two major techniques are proposed. The first one is a fault-inactivation method that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-transformation method that can transform the problem of distinguishing two transition faults into the problem of detecting a transition fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for transition faults. Furthermore, both methods can deal with multiple fault pairs at the same time and thus not only the total CPU time can be significantly reduced but also the dynamic test compaction capability of the ATPG tool can be utilized. Experimental results on all possible transition-fault pairs of both ISCAS'89 and IWLS'05 benchmark circuits show that the fault-inactivation method can distinguish about 95.6% of distinguishable fault pairs quickly and the fault-transformation method can deal with almost all the remaining indistinguished fault pairs. The average ratio of the number of diagnosis patterns over that of original test patterns is only 0.41.

Original languageEnglish
Title of host publicationProceedings - 2014 IEEE International Test Conference, ITC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479947225
DOIs
Publication statusPublished - 2015 Feb 6
Event45th IEEE International Test Conference, ITC 2014 - Seattle, United States
Duration: 2014 Oct 212014 Oct 23

Publication series

NameProceedings - International Test Conference
Volume2015-February
ISSN (Print)1089-3539

Other

Other45th IEEE International Test Conference, ITC 2014
CountryUnited States
CitySeattle
Period14-10-2114-10-23

Fingerprint

Fault
Networks (circuits)
Failure analysis
Program processors
Compaction
CPU Time
Fault Diagnosis
Transform
Benchmark

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Lee, K. J., & Wu, C. H. (2015). An efficient diagnosis-aware pattern generation procedure for transition faults. In Proceedings - 2014 IEEE International Test Conference, ITC 2014 [7035361] (Proceedings - International Test Conference; Vol. 2015-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TEST.2014.7035361
Lee, Kuen Jong ; Wu, Cheng Hung. / An efficient diagnosis-aware pattern generation procedure for transition faults. Proceedings - 2014 IEEE International Test Conference, ITC 2014. Institute of Electrical and Electronics Engineers Inc., 2015. (Proceedings - International Test Conference).
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abstract = "This paper presents an efficient transition-fault diagnosis pattern generation procedure to identify equivalent-fault pairs and generate diagnosis patterns for nonequivalent-fault pairs. Two major techniques are proposed. The first one is a fault-inactivation method that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-transformation method that can transform the problem of distinguishing two transition faults into the problem of detecting a transition fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for transition faults. Furthermore, both methods can deal with multiple fault pairs at the same time and thus not only the total CPU time can be significantly reduced but also the dynamic test compaction capability of the ATPG tool can be utilized. Experimental results on all possible transition-fault pairs of both ISCAS'89 and IWLS'05 benchmark circuits show that the fault-inactivation method can distinguish about 95.6{\%} of distinguishable fault pairs quickly and the fault-transformation method can deal with almost all the remaining indistinguished fault pairs. The average ratio of the number of diagnosis patterns over that of original test patterns is only 0.41.",
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Lee, KJ & Wu, CH 2015, An efficient diagnosis-aware pattern generation procedure for transition faults. in Proceedings - 2014 IEEE International Test Conference, ITC 2014., 7035361, Proceedings - International Test Conference, vol. 2015-February, Institute of Electrical and Electronics Engineers Inc., 45th IEEE International Test Conference, ITC 2014, Seattle, United States, 14-10-21. https://doi.org/10.1109/TEST.2014.7035361

An efficient diagnosis-aware pattern generation procedure for transition faults. / Lee, Kuen Jong; Wu, Cheng Hung.

Proceedings - 2014 IEEE International Test Conference, ITC 2014. Institute of Electrical and Electronics Engineers Inc., 2015. 7035361 (Proceedings - International Test Conference; Vol. 2015-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lee KJ, Wu CH. An efficient diagnosis-aware pattern generation procedure for transition faults. In Proceedings - 2014 IEEE International Test Conference, ITC 2014. Institute of Electrical and Electronics Engineers Inc. 2015. 7035361. (Proceedings - International Test Conference). https://doi.org/10.1109/TEST.2014.7035361