An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults

Cheng Hung Wu, Kuen Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Fault Diagnosis is a critical process to identify the locations of physical defects in advanced integrated circuits. Current diagnosis tools often report multiple types of faults as defect candidates. Thus an efficient method to distinguish different types of faults is highly desired. Stuck-at and bridging faults are two most commonly used DC fault models during diagnosis. In this paper we present an efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. Two major techniques are proposed. The first one is a fault-inactivation method (FIM) that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-types-transformation method (FTTM) that can transform the problem of distinguishing a stuck-at fault and a bridging fault into the problem of detecting a stuck-at fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for stuck-at faults. Furthermore, both methods can deal with multiple fault pairs at a time and thus not only is the required CPU time small but also the dynamic test compaction capability of the ATPG tool can be utilized. Experiments on a large number of randomly selected fault pairs in ISCAS'89 and IWLS'05 benchmark circuits have been carried out. The results show that the FIM can distinguish about 91.9% of distinguishable fault pairs quickly and the FTTM can distinguish all other distinguishable fault pairs and identify all equivalent fault pairs. The average ratio of the number of diagnosis patterns over that of the test patterns for stuck-at faults is only 0.64. On average, one diagnosis pattern can distinguish 10.89 fault pairs.

Original languageEnglish
Title of host publicationProceedings - 23rd Asian Test Symposium, ATS 2014
PublisherIEEE Computer Society
Pages306-311
Number of pages6
ISBN (Electronic)9781479960309
DOIs
Publication statusPublished - 2014 Dec 7
Event23rd Asian Test Symposium, ATS 2014 - Hangzhou, China
Duration: 2014 Nov 162014 Nov 19

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other23rd Asian Test Symposium, ATS 2014
CountryChina
CityHangzhou
Period14-11-1614-11-19

Fingerprint

Defects
Networks (circuits)
Failure analysis
Program processors
Integrated circuits
Compaction
Experiments

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Wu, C. H., & Lee, K. J. (2014). An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. In Proceedings - 23rd Asian Test Symposium, ATS 2014 (pp. 306-311). [06979118] (Proceedings of the Asian Test Symposium). IEEE Computer Society. https://doi.org/10.1109/ATS.2014.56
Wu, Cheng Hung ; Lee, Kuen Jong. / An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. Proceedings - 23rd Asian Test Symposium, ATS 2014. IEEE Computer Society, 2014. pp. 306-311 (Proceedings of the Asian Test Symposium).
@inproceedings{0007281af7214e1fa3c4bb15178c1c51,
title = "An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults",
abstract = "Fault Diagnosis is a critical process to identify the locations of physical defects in advanced integrated circuits. Current diagnosis tools often report multiple types of faults as defect candidates. Thus an efficient method to distinguish different types of faults is highly desired. Stuck-at and bridging faults are two most commonly used DC fault models during diagnosis. In this paper we present an efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. Two major techniques are proposed. The first one is a fault-inactivation method (FIM) that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-types-transformation method (FTTM) that can transform the problem of distinguishing a stuck-at fault and a bridging fault into the problem of detecting a stuck-at fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for stuck-at faults. Furthermore, both methods can deal with multiple fault pairs at a time and thus not only is the required CPU time small but also the dynamic test compaction capability of the ATPG tool can be utilized. Experiments on a large number of randomly selected fault pairs in ISCAS'89 and IWLS'05 benchmark circuits have been carried out. The results show that the FIM can distinguish about 91.9{\%} of distinguishable fault pairs quickly and the FTTM can distinguish all other distinguishable fault pairs and identify all equivalent fault pairs. The average ratio of the number of diagnosis patterns over that of the test patterns for stuck-at faults is only 0.64. On average, one diagnosis pattern can distinguish 10.89 fault pairs.",
author = "Wu, {Cheng Hung} and Lee, {Kuen Jong}",
year = "2014",
month = "12",
day = "7",
doi = "10.1109/ATS.2014.56",
language = "English",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "306--311",
booktitle = "Proceedings - 23rd Asian Test Symposium, ATS 2014",
address = "United States",

}

Wu, CH & Lee, KJ 2014, An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. in Proceedings - 23rd Asian Test Symposium, ATS 2014., 06979118, Proceedings of the Asian Test Symposium, IEEE Computer Society, pp. 306-311, 23rd Asian Test Symposium, ATS 2014, Hangzhou, China, 14-11-16. https://doi.org/10.1109/ATS.2014.56

An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. / Wu, Cheng Hung; Lee, Kuen Jong.

Proceedings - 23rd Asian Test Symposium, ATS 2014. IEEE Computer Society, 2014. p. 306-311 06979118 (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults

AU - Wu, Cheng Hung

AU - Lee, Kuen Jong

PY - 2014/12/7

Y1 - 2014/12/7

N2 - Fault Diagnosis is a critical process to identify the locations of physical defects in advanced integrated circuits. Current diagnosis tools often report multiple types of faults as defect candidates. Thus an efficient method to distinguish different types of faults is highly desired. Stuck-at and bridging faults are two most commonly used DC fault models during diagnosis. In this paper we present an efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. Two major techniques are proposed. The first one is a fault-inactivation method (FIM) that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-types-transformation method (FTTM) that can transform the problem of distinguishing a stuck-at fault and a bridging fault into the problem of detecting a stuck-at fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for stuck-at faults. Furthermore, both methods can deal with multiple fault pairs at a time and thus not only is the required CPU time small but also the dynamic test compaction capability of the ATPG tool can be utilized. Experiments on a large number of randomly selected fault pairs in ISCAS'89 and IWLS'05 benchmark circuits have been carried out. The results show that the FIM can distinguish about 91.9% of distinguishable fault pairs quickly and the FTTM can distinguish all other distinguishable fault pairs and identify all equivalent fault pairs. The average ratio of the number of diagnosis patterns over that of the test patterns for stuck-at faults is only 0.64. On average, one diagnosis pattern can distinguish 10.89 fault pairs.

AB - Fault Diagnosis is a critical process to identify the locations of physical defects in advanced integrated circuits. Current diagnosis tools often report multiple types of faults as defect candidates. Thus an efficient method to distinguish different types of faults is highly desired. Stuck-at and bridging faults are two most commonly used DC fault models during diagnosis. In this paper we present an efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. Two major techniques are proposed. The first one is a fault-inactivation method (FIM) that can quickly distinguish most fault pairs by inactivating one fault while detecting the other in each fault pair. The second one is a fault-types-transformation method (FTTM) that can transform the problem of distinguishing a stuck-at fault and a bridging fault into the problem of detecting a stuck-at fault. Both methods involve only one copy of the original circuit and require only an ordinary ATPG tool for stuck-at faults. Furthermore, both methods can deal with multiple fault pairs at a time and thus not only is the required CPU time small but also the dynamic test compaction capability of the ATPG tool can be utilized. Experiments on a large number of randomly selected fault pairs in ISCAS'89 and IWLS'05 benchmark circuits have been carried out. The results show that the FIM can distinguish about 91.9% of distinguishable fault pairs quickly and the FTTM can distinguish all other distinguishable fault pairs and identify all equivalent fault pairs. The average ratio of the number of diagnosis patterns over that of the test patterns for stuck-at faults is only 0.64. On average, one diagnosis pattern can distinguish 10.89 fault pairs.

UR - http://www.scopus.com/inward/record.url?scp=84919976779&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84919976779&partnerID=8YFLogxK

U2 - 10.1109/ATS.2014.56

DO - 10.1109/ATS.2014.56

M3 - Conference contribution

AN - SCOPUS:84919976779

T3 - Proceedings of the Asian Test Symposium

SP - 306

EP - 311

BT - Proceedings - 23rd Asian Test Symposium, ATS 2014

PB - IEEE Computer Society

ER -

Wu CH, Lee KJ. An efficient diagnosis pattern generation procedure to distinguish stuck-at faults and bridging faults. In Proceedings - 23rd Asian Test Symposium, ATS 2014. IEEE Computer Society. 2014. p. 306-311. 06979118. (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2014.56