An efficient NBTI-aware wake-up strategy for power-gated designs

Kun Wei Chiu, Yu Guang Chen, Ing Chao Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The wake-up process of a power-gated design may induce an excessive surge current and threaten the signal integrity. A proper wake-up sequence should be carefully designed to avoid surge current violations. On the other hand, PMOS sleep transistors may suffer from the negative-bias temperature instability (NBTI) effect which results in decreased driving current. Conventional wake-up sequence decision approaches do not consider the NBTI effect, which may result in a longer or unacceptable wake-up time after circuit aging. Therefore, in this paper, we propose a novel NBTI-aware wake-up strategy to reduce the average wake-up time within a circuit lifetime. Our strategy first finds a set of proper wake-up sequences for different aging scenarios (i.e. after a certain period of aging), and then dynamically reconfigures the wake-up sequences at runtime. The experimental results show that compared to a traditional fixed wake-up sequence approach, our strategy can reduce average wake-up time by as much as 45.04% with only 3.7% extra area overhead for the reconfiguration structure.

Original languageEnglish
Title of host publicationProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages901-904
Number of pages4
ISBN (Electronic)9783981926316
DOIs
Publication statusPublished - 2018 Apr 19
Event2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 - Dresden, Germany
Duration: 2018 Mar 192018 Mar 23

Publication series

NameProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume2018-January

Other

Other2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
CountryGermany
CityDresden
Period18-03-1918-03-23

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture
  • Software
  • Information Systems and Management

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