An elimination design for drift rate effects of MEMS-based inertial devices

Yung Yue Chen, Shyang Jye Chang, Chiung Yau Huang, Yung Hsinag Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

An advanced elimination algorithm based on the dynamic PID control concept for treating drift rate effects of MEMS-Based inertial devices, such as accelerometer and gyroscope is proposed in this investigation. Effects of drift rates of inertial devices strongly influence the performance of the relative motion sensing products that are designed by MEMS-based inertial devices, e.g., small regions of variation of drift rates of accelerometer and gyroscope will cause a serious effect in pure MEMS-based inertial navigation system (INS) with a worst tracking error >100m within a period of time 50 second, and this worst character also largely reduces the compensation role of INS to GPS. The design objective of this proposed method is to offer a simple structure, stable and precise drift rate model for the MEMS-based inertial devices, and then successfully eliminate the diverge character in integration: single integration ∫ for gyroscope and double integration ∫ for accelerometer.

Original languageEnglish
Title of host publication2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008
Pages153-155
Number of pages3
DOIs
Publication statusPublished - 2008
Event2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008 - Taipei, Taiwan
Duration: 2008 Oct 222008 Oct 24

Publication series

Name2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008

Other

Other2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008
CountryTaiwan
CityTaipei
Period08-10-2208-10-24

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Chen, Y. Y., Chang, S. J., Huang, C. Y., & Chen, Y. H. (2008). An elimination design for drift rate effects of MEMS-based inertial devices. In 2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008 (pp. 153-155). [4783830] (2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008). https://doi.org/10.1109/IMPACT.2008.4783830