@inproceedings{e413142c602d4b23a992aaa72d6ea745,
title = "An energy-efficient nonvolatile microprocessor considering software-hardware interaction for energy harvesting applications",
abstract = "Normally-off computing (NoC) systems have constantly-off and instantly-on characteristics, leading to considerably lower idle power consumption than other low-power systems. This paper proposes a software procedure and two system hardware design optimization methods, namely a programmable restore entry decision for increasing system recovery correctness and nonvolatile (NV) storage reduction with selective backup system states and selective store. Thus, NV microprocessors (NV-μPs) can reduce the energy and area overhead. The proposed NV-μP uses a 90-nm MSP430-compatible μP embedded with resistive random-access memory. The proposed NV-μP was compared with three state-of-the-art NV-μP methods: full replacement, parallel compare and compress codec, and NV logic array. Compared with the three methods, the proposed software procedure significantly increased the restore correctness to achieve 100% stability for realistic electrocardiography applications. Regarding hardware, the system store energy was reduced by at least 23.7%, compared with the three approaches. In contrast to the full replacement approach, the area overhead was reduced by 42%.",
author = "Chien, {Tsai Kan} and Chiou, {Lih Yih} and Lee, {Chang Chia} and Chuang, {Yao Chun} and Ke, {Shien Han} and Sheu, {Shyh Shyuan} and Li, {Heng Yuan} and Wang, {Pei Hua} and Ku, {Tzu Kun} and Tsai, {Ming Jinn} and Wu, {Chih I.}",
note = "Funding Information: The authors thank the Ministry of Science and Technology, Taiwan, for the research grant (MOST 102-2221-E-006-280-MY3). Publisher Copyright: {\textcopyright} 2016 IEEE. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.; 2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016 ; Conference date: 25-04-2016 Through 27-04-2016",
year = "2016",
month = may,
day = "31",
doi = "10.1109/VLSI-DAT.2016.7482577",
language = "English",
series = "2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016",
address = "United States",
}