An energy-efficient nonvolatile microprocessor considering software-hardware interaction for energy harvesting applications

Tsai Kan Chien, Lih Yih Chiou, Chang Chia Lee, Yao Chun Chuang, Shien Han Ke, Shyh Shyuan Sheu, Heng Yuan Li, Pei Hua Wang, Tzu Kun Ku, Ming Jinn Tsai, Chih I. Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Normally-off computing (NoC) systems have constantly-off and instantly-on characteristics, leading to considerably lower idle power consumption than other low-power systems. This paper proposes a software procedure and two system hardware design optimization methods, namely a programmable restore entry decision for increasing system recovery correctness and nonvolatile (NV) storage reduction with selective backup system states and selective store. Thus, NV microprocessors (NV-μPs) can reduce the energy and area overhead. The proposed NV-μP uses a 90-nm MSP430-compatible μP embedded with resistive random-access memory. The proposed NV-μP was compared with three state-of-the-art NV-μP methods: full replacement, parallel compare and compress codec, and NV logic array. Compared with the three methods, the proposed software procedure significantly increased the restore correctness to achieve 100% stability for realistic electrocardiography applications. Regarding hardware, the system store energy was reduced by at least 23.7%, compared with the three approaches. In contrast to the full replacement approach, the area overhead was reduced by 42%.

Original languageEnglish
Title of host publication2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467394987
DOIs
Publication statusPublished - 2016 May 31
Event2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016 - Hsinchu, Taiwan
Duration: 2016 Apr 252016 Apr 27

Publication series

Name2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016

Other

Other2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016
CountryTaiwan
CityHsinchu
Period16-04-2516-04-27

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Instrumentation

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