An FPGA-based Re-configurable Functional Tester for Memory Chips

Cheng-Wen Wu, J.-R. Huang, C.K. Ong, K.T. Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
Original languageEnglish
Title of host publication9th IEEE Asian Test Symp. (ATS)
Place of PublicationTaipei
Publication statusPublished - 2000 Dec

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