| Original language | English |
|---|---|
| Title of host publication | 9th IEEE Asian Test Symp. (ATS) |
| Place of Publication | Taipei |
| Publication status | Published - 2000 Dec |
An FPGA-based Re-configurable Functional Tester for Memory Chips
- Cheng-Wen Wu
- , J.-R. Huang
- , C.K. Ong
- , K.T. Cheng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
8
Citations
(Scopus)