TY - GEN
T1 - An FPGA-based test platform for analyzing data retention time distribution of DRAMs
AU - Hou, Chih Sheng
AU - Li, Jin Fu
AU - Lo, Chih Yen
AU - Kwai, Ding Ming
AU - Chou, Yung Fa
AU - Wu, Cheng Wen
PY - 2013/8/15
Y1 - 2013/8/15
N2 - Data retention time distribution of a dynamic random access memory (DRAM) has a heavy impact on its yield, power, and performance. Accurate and detailed information of data retention time distribution thus is very important for the DRAM designer and user. This paper proposes an FPGA-based test platform for analyzing the data retention time distribution of a DRAM. Based on the test platform, a test flow is also proposed to classify the DRAM cells with different data retention times with respect to different supply voltage and temperature. We have demonstrated the test platform and test flow using a Micron 2Gb DRAM.
AB - Data retention time distribution of a dynamic random access memory (DRAM) has a heavy impact on its yield, power, and performance. Accurate and detailed information of data retention time distribution thus is very important for the DRAM designer and user. This paper proposes an FPGA-based test platform for analyzing the data retention time distribution of a DRAM. Based on the test platform, a test flow is also proposed to classify the DRAM cells with different data retention times with respect to different supply voltage and temperature. We have demonstrated the test platform and test flow using a Micron 2Gb DRAM.
UR - http://www.scopus.com/inward/record.url?scp=84881321864&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881321864&partnerID=8YFLogxK
U2 - 10.1109/VLDI-DAT.2013.6533853
DO - 10.1109/VLDI-DAT.2013.6533853
M3 - Conference contribution
AN - SCOPUS:84881321864
SN - 9781467344357
T3 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
BT - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
T2 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
Y2 - 22 April 2013 through 24 April 2013
ER -