An improved model of software reliability growth under time-dependent learning effects

Kuei-Chen Chiu

doi:10.1109/ICQR.2011.6031707

An improved model of software reliability growth under time-dependent learning effects

Kuei-Chen Chiu

Department of Industrial and Information Management

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

Abstract

Over the last two decades, various software reliability growth models (SRGM) have been proposed, and there has been a gradual but marked shift in the balance between software reliability and software testing cost in recent years. Chiu and Huang (2008) provided a Software Reliability Growth Model from the Perspective of Learning Effects, which is able to reasonably describe the S-shaped and exponential-shaped types of behaviors simultaneously, and offers better performance when fitting different data with consideration of the learning effects. However, this earlier model assumes that the learning effects are constant. In contrast, this paper discusses a software reliability growth model with time-dependent learning effects.

Original language	English
Title of host publication	2011 IEEE International Conference on Quality and Reliability, ICQR 2011
Pages	191-194
Number of pages	4
DOIs	https://doi.org/10.1109/ICQR.2011.6031707
Publication status	Published - 2011 Oct 24
Event	2011 IEEE International Conference on Quality and Reliability, ICQR 2011 - Bangkok, Thailand Duration: 2011 Sept 14 → 2011 Sept 17

Publication series

Name	2011 IEEE International Conference on Quality and Reliability, ICQR 2011

Conference

Conference	2011 IEEE International Conference on Quality and Reliability, ICQR 2011
Country/Territory	Thailand
City	Bangkok
Period	11-09-14 → 11-09-17

All Science Journal Classification (ASJC) codes

Safety, Risk, Reliability and Quality

Access to Document

10.1109/ICQR.2011.6031707

Cite this

@inproceedings{762e4a5d63634e5aaf9dc57a598d561b,

title = "An improved model of software reliability growth under time-dependent learning effects",

abstract = "Over the last two decades, various software reliability growth models (SRGM) have been proposed, and there has been a gradual but marked shift in the balance between software reliability and software testing cost in recent years. Chiu and Huang (2008) provided a Software Reliability Growth Model from the Perspective of Learning Effects, which is able to reasonably describe the S-shaped and exponential-shaped types of behaviors simultaneously, and offers better performance when fitting different data with consideration of the learning effects. However, this earlier model assumes that the learning effects are constant. In contrast, this paper discusses a software reliability growth model with time-dependent learning effects.",

author = "Kuei-Chen Chiu",

year = "2011",

month = oct,

day = "24",

doi = "10.1109/ICQR.2011.6031707",

language = "English",

isbn = "9781457706288",

series = "2011 IEEE International Conference on Quality and Reliability, ICQR 2011",

pages = "191--194",

booktitle = "2011 IEEE International Conference on Quality and Reliability, ICQR 2011",

note = "2011 IEEE International Conference on Quality and Reliability, ICQR 2011 ; Conference date: 14-09-2011 Through 17-09-2011",

}

Chiu, K-C 2011, An improved model of software reliability growth under time-dependent learning effects. in 2011 IEEE International Conference on Quality and Reliability, ICQR 2011., 6031707, 2011 IEEE International Conference on Quality and Reliability, ICQR 2011, pp. 191-194, 2011 IEEE International Conference on Quality and Reliability, ICQR 2011, Bangkok, Thailand, 11-09-14. https://doi.org/10.1109/ICQR.2011.6031707

An improved model of software reliability growth under time-dependent learning effects. / Chiu, Kuei-Chen.
2011 IEEE International Conference on Quality and Reliability, ICQR 2011. 2011. p. 191-194 6031707 (2011 IEEE International Conference on Quality and Reliability, ICQR 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - An improved model of software reliability growth under time-dependent learning effects

AU - Chiu, Kuei-Chen

PY - 2011/10/24

Y1 - 2011/10/24

N2 - Over the last two decades, various software reliability growth models (SRGM) have been proposed, and there has been a gradual but marked shift in the balance between software reliability and software testing cost in recent years. Chiu and Huang (2008) provided a Software Reliability Growth Model from the Perspective of Learning Effects, which is able to reasonably describe the S-shaped and exponential-shaped types of behaviors simultaneously, and offers better performance when fitting different data with consideration of the learning effects. However, this earlier model assumes that the learning effects are constant. In contrast, this paper discusses a software reliability growth model with time-dependent learning effects.

AB - Over the last two decades, various software reliability growth models (SRGM) have been proposed, and there has been a gradual but marked shift in the balance between software reliability and software testing cost in recent years. Chiu and Huang (2008) provided a Software Reliability Growth Model from the Perspective of Learning Effects, which is able to reasonably describe the S-shaped and exponential-shaped types of behaviors simultaneously, and offers better performance when fitting different data with consideration of the learning effects. However, this earlier model assumes that the learning effects are constant. In contrast, this paper discusses a software reliability growth model with time-dependent learning effects.

UR - http://www.scopus.com/inward/record.url?scp=80054742130&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80054742130&partnerID=8YFLogxK

U2 - 10.1109/ICQR.2011.6031707

DO - 10.1109/ICQR.2011.6031707

M3 - Conference contribution

AN - SCOPUS:80054742130

SN - 9781457706288

T3 - 2011 IEEE International Conference on Quality and Reliability, ICQR 2011

SP - 191

EP - 194

BT - 2011 IEEE International Conference on Quality and Reliability, ICQR 2011

T2 - 2011 IEEE International Conference on Quality and Reliability, ICQR 2011

Y2 - 14 September 2011 through 17 September 2011

ER -

An improved model of software reliability growth under time-dependent learning effects

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this