| Original language | English |
|---|---|
| Title of host publication | 9th VLSI Design/CAD Symposium |
| Pages | 149-152 |
| Publication status | Published - 1998 Aug |
An improved VLSI test economics analysis system
J.-D. Lin, J.-M. Lu, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
91
Citations
(Scopus)