An instantaneous phase shifting ESPI system for dynamic deformation measurement

T. Y. Chen, C. H. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this study, an ESPI measurement system which is capable of grabbing four phase-shifted interferometric images instantaneously (or simultaneously) is developed for out-of-plane dynamic deformation measurement. A new polarization phase-shifting interferometric system is designed. The system constructed allows the four phase-shifted images to be grabbed by four CCD simultaneously. And digital image correlation method was applied to correct the pixel position mismatch among the four images. Thereafter, the phase at each pixel can be calculated for further obtaining the out-of-plane displacement. Test of the system on an edge-clamped circular plate heated from behind is demonstrated. The results reveal that the proposed system is applicable for the dynamic deformation measurement.

Original languageEnglish
Title of host publicationOptical Measurements, Modeling, and Metrology - Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
PublisherSpringer New York LLC
Pages279-283
Number of pages5
ISBN (Print)9781461402275
DOIs
Publication statusPublished - 2011
Event2011 SEM Annual Conference on Experimental and Applied Mechanics - Uncasville, CT, United States
Duration: 2011 Jun 132011 Jun 16

Publication series

NameConference Proceedings of the Society for Experimental Mechanics Series
Volume5
ISSN (Print)2191-5644
ISSN (Electronic)2191-5652

Other

Other2011 SEM Annual Conference on Experimental and Applied Mechanics
Country/TerritoryUnited States
CityUncasville, CT
Period11-06-1311-06-16

All Science Journal Classification (ASJC) codes

  • General Engineering
  • Computational Mechanics
  • Mechanical Engineering

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