An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing

Haw Ching Yang, Muhammad Adnan, Chih Hung Huang, Fan Tien Cheng, Yu Lung Lo, Chih Hua Hsu

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science