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An on-chip march pattern generator for testing embedded memory cores
W. L. Wang,
K. J. Lee
, J. F. Wang
Department of Electrical Engineering
Research output
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Contribution to journal
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Article
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peer-review
16
Citations (Scopus)
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Engineering & Materials Science
Data storage equipment
100%
Testing
84%
Shift registers
40%
Set theory
21%
Computer hardware
19%