Abstract
A new mixed-mode boundary scan architecture is developed. The digital part of this architecture complies with the IEEE Std 1149.1. For the analogue part, we propose a new boundary scan cell design and define 4 analogue test instructions. The control signals for each instruction are also described.
Original language | English |
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Pages (from-to) | 704-705 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 32 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1996 Apr 11 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering