Analogue boundary scan architecture for DC and AC testing

Kuen-Jong Lee, Tian Pao Lee, Rong Chang Wen, Zhe Yi Lin

Research output: Contribution to journalArticle

2 Citations (Scopus)


A new mixed-mode boundary scan architecture is developed. The digital part of this architecture complies with the IEEE Std 1149.1. For the analogue part, we propose a new boundary scan cell design and define 4 analogue test instructions. The control signals for each instruction are also described.

Original languageEnglish
Pages (from-to)704-705
Number of pages2
JournalElectronics Letters
Issue number8
Publication statusPublished - 1996 Apr 11

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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