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Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

  • Sanjoy Paul
  • , Sachit Grover
  • , Ingrid L. Repins
  • , Brian M. Keyes
  • , Miguel A. Contreras
  • , Kannan Ramanathan
  • , Rommel Noufi
  • , Zhibo Zhao
  • , Feng Liao
  • , Jian V. Li

Research output: Contribution to journal › Article › peer-review

Abstract

The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

Original languageEnglish
Pages (from-to)871-878
Number of pages8
JournalIEEE Journal of Photovoltaics
Volume8
Issue number3
DOIs
Publication statusPublished - 2018 May

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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