TY - JOUR
T1 - Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs
AU - Huang, Chun Po
AU - Ting, Hsin Wen
AU - Chang, Soon Jyh
N1 - Funding Information:
This work was supported by the Ministry of Science and Technology, Taiwan, under Grant MOST 104-2220-E-006-012.
Publisher Copyright:
© 2016 IEEE.
PY - 2016/8
Y1 - 2016/8
N2 - This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper.
AB - This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper.
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U2 - 10.1109/TIM.2016.2562198
DO - 10.1109/TIM.2016.2562198
M3 - Article
AN - SCOPUS:84969497978
VL - 65
SP - 1804
EP - 1817
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
SN - 0018-9456
IS - 8
M1 - 7470271
ER -