Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

Chun Po Huang, Hsin Wen Ting, Soon Jyh Chang

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper.

Original languageEnglish
Article number7470271
Pages (from-to)1804-1817
Number of pages14
JournalIEEE Transactions on Instrumentation and Measurement
Issue number8
Publication statusPublished - 2016 Aug

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering


Dive into the research topics of 'Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs'. Together they form a unique fingerprint.

Cite this