Analysis of pentacene thin film transistors in different atmospheres

Yu Wu Wang; Horng-Long Cheng; Yi Kai Wang; Tang Hsiang Hu; Jia Chong Ho; Cheng Chung Lee; Tan Fu Lei; Ching Fa Yeh

Analysis of pentacene thin film transistors in different atmospheres

Yu Wu Wang, Horng-Long Cheng, Yi Kai Wang, Tang Hsiang Hu, Jia Chong Ho, Cheng Chung Lee, Tan Fu Lei, Ching Fa Yeh

Department of Photonics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.

Original language	English
Title of host publication	Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05
Editors	H.P. David Shieh, F.C. Chen
Pages	520-522
Number of pages	3
Publication status	Published - 2005 Dec 1
Event	International Display Manufacturing Conference and Exhibition, IDMC'05 - Taipei, Japan Duration: 2005 Feb 21 → 2005 Feb 24

Publication series

Name	International Display Manufacturing Conference and Exhibition, IDMC'05

Other

Other	International Display Manufacturing Conference and Exhibition, IDMC'05
Country	Japan
City	Taipei
Period	05-02-21 → 05-02-24

All Science Journal Classification (ASJC) codes

Engineering(all)

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Wang, Y. W., Cheng, H-L., Wang, Y. K., Hu, T. H., Ho, J. C., Lee, C. C., Lei, T. F., & Yeh, C. F. (2005). Analysis of pentacene thin film transistors in different atmospheres. In H. P. David Shieh, & F. C. Chen (Eds.), Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05 (pp. 520-522). (International Display Manufacturing Conference and Exhibition, IDMC'05).

Wang, Yu Wu ; Cheng, Horng-Long ; Wang, Yi Kai ; Hu, Tang Hsiang ; Ho, Jia Chong ; Lee, Cheng Chung ; Lei, Tan Fu ; Yeh, Ching Fa. / Analysis of pentacene thin film transistors in different atmospheres. Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. editor / H.P. David Shieh ; F.C. Chen. 2005. pp. 520-522 (International Display Manufacturing Conference and Exhibition, IDMC'05).

@inproceedings{bfc4e3ff739240239a61222c2468eebe,

title = "Analysis of pentacene thin film transistors in different atmospheres",

abstract = "This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.",

author = "Wang, {Yu Wu} and Horng-Long Cheng and Wang, {Yi Kai} and Hu, {Tang Hsiang} and Ho, {Jia Chong} and Lee, {Cheng Chung} and Lei, {Tan Fu} and Yeh, {Ching Fa}",

year = "2005",

month = dec,

day = "1",

language = "English",

isbn = "9572852221",

series = "International Display Manufacturing Conference and Exhibition, IDMC'05",

pages = "520--522",

editor = "{David Shieh}, H.P. and F.C. Chen",

booktitle = "Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05",

note = "International Display Manufacturing Conference and Exhibition, IDMC'05 ; Conference date: 21-02-2005 Through 24-02-2005",

}

Wang, YW, Cheng, H-L, Wang, YK, Hu, TH, Ho, JC, Lee, CC, Lei, TF & Yeh, CF 2005, Analysis of pentacene thin film transistors in different atmospheres. in HP David Shieh & FC Chen (eds), Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. International Display Manufacturing Conference and Exhibition, IDMC'05, pp. 520-522, International Display Manufacturing Conference and Exhibition, IDMC'05, Taipei, Japan, 05-02-21.

Analysis of pentacene thin film transistors in different atmospheres. / Wang, Yu Wu; Cheng, Horng-Long; Wang, Yi Kai; Hu, Tang Hsiang; Ho, Jia Chong; Lee, Cheng Chung; Lei, Tan Fu; Yeh, Ching Fa.

Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. ed. / H.P. David Shieh; F.C. Chen. 2005. p. 520-522 (International Display Manufacturing Conference and Exhibition, IDMC'05).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Analysis of pentacene thin film transistors in different atmospheres

AU - Wang, Yu Wu

AU - Cheng, Horng-Long

AU - Wang, Yi Kai

AU - Hu, Tang Hsiang

AU - Ho, Jia Chong

AU - Lee, Cheng Chung

AU - Lei, Tan Fu

AU - Yeh, Ching Fa

PY - 2005/12/1

Y1 - 2005/12/1

N2 - This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.

AB - This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.

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M3 - Conference contribution

AN - SCOPUS:33644660344

SN - 9572852221

T3 - International Display Manufacturing Conference and Exhibition, IDMC'05

SP - 520

EP - 522

BT - Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05

A2 - David Shieh, H.P.

A2 - Chen, F.C.

T2 - International Display Manufacturing Conference and Exhibition, IDMC'05

Y2 - 21 February 2005 through 24 February 2005

ER -