Analysis of thermal resistance structure of single-chip LEDs using transient thermal resistance measurement method

Chen I. Chao, Wei Keng Lin, H. Paul Wang, Shao Wen Chen, Pen Cheng Wang, Kuo Hsiang Chien

Research output: Contribution to journalArticle

Abstract

The study used the theoretical basis of the transient thermal resistance measurement method to establish an LED thermal resistance measurement system. The Transient Thermal Resistance Structure Analysis (TTRS Analysis) software designed and developed for this study was used to analyze its internal structure in order to establish the overall thermal resistance structure of the LED. When comparing the results to the theoretical value, it was found that the error values were kept to within 10%, indicating extremely high repeatability of the measurement results.

Original languageEnglish
Pages (from-to)527-537
Number of pages11
JournalJournal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao
Volume34
Issue number6
Publication statusPublished - 2013 Dec

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering

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