Analysis of ultrathin organic inverters by using in situ grazing incidence X-ray diffraction under high bending times and low voltage

Physics & Astronomy

• inverters 100%
• grazing incidence 85%
• low voltage 78%
• diffraction 43%
• x rays 36%
• electric potential 26%
• organic semiconductors 18%
• polyimides 16%
• shift 9%
• electronics 8%

Engineering & Materials Science

• X ray diffraction 79%
• Electric potential 41%
• Organic semiconductor materials 32%
• Flexible electronics 28%
• Mechanical stability 26%
• Polyimides 23%
• Diffraction 21%
• Aluminum oxide 19%
• Substrates 14%

Chemical Compounds

• Voltage 58%
• X-Ray Diffraction 39%
• Time 29%
• Polyimide Macromolecule 25%
• Dielectric Material 23%
• Semiconductor 20%