Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect

Shi Qun Zheng, Ing-Chao Lin, Yen Han Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

NBTI (Negative Bias Temperature Instability) which can degrade the switching speed of PMOS transistors has become a major reliability challenge. In this paper, we investigate the throughput impact of NBTI on power and thermal-constraint multicore processors and show up to 30% degradation when both process variation and NBIT are considered. Then we evaluate the effectiveness of core rotation, adaptive voltage scaling and adaptive body biasing to improve the throughput of power and thermal constrained multicore processors. Our experimental results demonstrate 11.1% improvement in VDD is sufficient to guarantee throughput after 10-yr NBTI influence when processor variation is not considered. In contract, ABB technique is not able to recover throughput loss caused by NBTI.

Original languageEnglish
Title of host publicationGLSVLSI'11 - Proceedings of the 2011 Great Lakes Symposium on VLSI
Pages415-418
Number of pages4
DOIs
Publication statusPublished - 2011 Jun 3
Event21st Great Lakes Symposium on VLSI, GLSVLSI 2011 - Lausanne, Switzerland
Duration: 2011 May 22011 May 4

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Other

Other21st Great Lakes Symposium on VLSI, GLSVLSI 2011
CountrySwitzerland
CityLausanne
Period11-05-0211-05-04

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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