Anomalous hot-carrier-induced increase in saturation-region drain current in n-type lateral diffused metal-oxide-semiconductor transistors

Shiang Yu Chen, Jone F. Chen, J. R. Lee, K. M.Kuo Ming Wu, C. M. Liu, S. L. Hsu

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

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Engineering & Materials Science

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