Fingerprint
Dive into the research topics of 'Anomalous increase in hot-carrier-induced threshold voltage shift in n -type drain extended metal-oxide-semiconductor transistors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Anomalous increase in hot-carrier-induced threshold voltage shift in n -type drain extended metal-oxide-semiconductor transistors
Jone F. Chen, Shiang Yu Chen, J. R. Lee, Kuo Ming Wu, Tsung Yi Huang, C. M. Liu
Research output: Contribution to journal › Article › peer-review
1
Citation
(Scopus)