Anomaly discrimination in hyperspectral imagery

Shih Yu Chen, Drew Paylor, Chein I. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Anomaly detection finds data samples whose signatures are spectrally distinct from their surrounding data samples. Unfortunately, it cannot discriminate the anomalies it detected one from another. In order to accomplish this task it requires a way of measuring spectral similarity such as spectral angle mapper (SAM) or spectral information divergence (SID) to determine if a detected anomaly is different from another. However, this arises in a challenging issue of how to find an appropriate thresholding value for this purpose. Interestingly, this issue has not received much attention in the past. This paper investigates the issue of anomaly discrimination which can differentiate detected anomalies without using any spectral measure. The ideas are to makes use unsupervised target detection algorithms, Automatic Target Generation Process (ATGP) coupled with an anomaly detector to distinguish detected anomalies. Experimental results show that the proposed methods are indeed very effective in anomaly discrimination.

Original languageEnglish
Title of host publicationSatellite Data Compression, Communications, and Processing X
PublisherSPIE
ISBN (Print)9781628410617
DOIs
Publication statusPublished - 2014
EventSatellite Data Compression, Communications, and Processing X - Baltimore, MD, United States
Duration: 2014 May 82014 May 9

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9124
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSatellite Data Compression, Communications, and Processing X
Country/TerritoryUnited States
CityBaltimore, MD
Period14-05-0814-05-09

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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