APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUIT

Chu-Sing Yang (Inventor)

Research output: Patent

Abstract

An apparatus for measuring an electrical parameter of a circuit includes a measuring unit, a plurality of connection terminals and a selection switch. The measuring unit measures the electrical parameter. The selection switch selectively causes a conduction between the selection switch and at least one of the plurality of connection terminals
Original languageEnglish
Patent number9063169
Publication statusPublished - 1800

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