Abstract
An apparatus for measuring an electrical parameter of a circuit includes a measuring unit, a plurality of connection terminals and a selection switch. The measuring unit measures the electrical parameter. The selection switch selectively causes a conduction between the selection switch and at least one of the plurality of connection terminals
| Translated title of the contribution | 用以量測一電路之複數電性參數的量測裝置及其量測方法 |
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| Original language | English |
| Patent number | 9063169 |
| Publication status | Published - 1800 |