Application of a Taguchi method technique in determining the laminating process parameters for a bonding sheet

Yu Tang Yen, Te Hua Fang, Yu Cheng Lin

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

This paper investigates the application of a Taguchi method to reduce warpage problem dealing with process parameters during production of bonding sheets. For this purpose, analysis was carried out by utilizing a combination of process parameters based on a two-level L12 Taguchi orthogonal design. The signal-to-noise and the analysis of variance are used to find the optimum levels and to indicate the impact of the process parameters on warpage. The results show that the method can reduce warpage by about 94%, and a verification test is also conducted to prove its effectiveness after the optimum levels of process parameters are determined. It can thus be concluded that this Taguchi method is suitable to solve the quality problems that occur due to warpage.

Original languageEnglish
Article number041005
JournalJournal of Electronic Packaging, Transactions of the ASME
Volume132
Issue number4
DOIs
Publication statusPublished - 2010 Dec 6

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Laminating
Taguchi methods
Analysis of variance (ANOVA)

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

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Application of a Taguchi method technique in determining the laminating process parameters for a bonding sheet. / Yen, Yu Tang; Fang, Te Hua; Lin, Yu Cheng.

In: Journal of Electronic Packaging, Transactions of the ASME, Vol. 132, No. 4, 041005, 06.12.2010.

Research output: Contribution to journalArticle

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