| Original language | English |
|---|---|
| Title of host publication | 2008 Mathematical Meeting and Annual Meeting of the Mathematical Society |
| Place of Publication | HsinChu, Taiwan |
| Publication status | Published - 2008 Dec 19 |
Application of Degradation Models on Reliability Assessment of Transistors
Shuen-Lin Jeng, M.-S. Hsieh
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution