Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih Hui Chang, Yun Chorng Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

Original languageEnglish
Title of host publication2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS
DOIs
Publication statusPublished - 2008 Sep 15
EventConference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS 2008 - San Jose, CA, United States
Duration: 2008 May 42008 May 9

Publication series

NameConference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series

Other

OtherConference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS 2008
CountryUnited States
CitySan Jose, CA
Period08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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  • Cite this

    Chang, S. H., & Chang, Y. C. (2008). Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles. In 2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS [4552508] (Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series). https://doi.org/10.1109/QELS.2008.4552508