Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih-hui Chang, Yun Chorng Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2008
PublisherOptical Society of America
ISBN (Print)9781557528599
Publication statusPublished - 2008 Jan 1
EventQuantum Electronics and Laser Science Conference, QELS 2008 - San Jose, CA, United States
Duration: 2008 May 42008 May 9

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2008
CountryUnited States
CitySan Jose, CA
Period08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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