Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles

Shih-hui Chang, Yun Chorng Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2008
PublisherOptical Society of America
ISBN (Print)9781557528599
Publication statusPublished - 2008
EventConference on Lasers and Electro-Optics, CLEO 2008 - San Jose, CA, United States
Duration: 2008 May 42008 May 9

Other

OtherConference on Lasers and Electro-Optics, CLEO 2008
CountryUnited States
CitySan Jose, CA
Period08-05-0408-05-09

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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