TY - GEN
T1 - Asian test symposium - Past, present and future - Past, p
AU - Inoue, Michiko
AU - Li, Xiaowei
AU - Wu, Cheng Wen
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/11
Y1 - 2019/11
N2 - The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.
AB - The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.
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U2 - 10.1109/ITC44170.2019.9000151
DO - 10.1109/ITC44170.2019.9000151
M3 - Conference contribution
AN - SCOPUS:85081558545
T3 - Proceedings - International Test Conference
BT - 2019 IEEE International Test Conference, ITC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE International Test Conference, ITC 2019
Y2 - 9 November 2019 through 15 November 2019
ER -