Asian test symposium - Past, present and future - Past, p

Michiko Inoue, Xiaowei Li, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.

Original languageEnglish
Title of host publication2019 IEEE International Test Conference, ITC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728148236
Publication statusPublished - 2019 Nov
Event2019 IEEE International Test Conference, ITC 2019 - Washington, United States
Duration: 2019 Nov 92019 Nov 15

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


Conference2019 IEEE International Test Conference, ITC 2019
Country/TerritoryUnited States

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics


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