Asian test symposium - Past, present and future - Past, p

Michiko Inoue; Xiaowei Li; Cheng Wen Wu

doi:10.1109/ITC44170.2019.9000151

Asian test symposium - Past, present and future - Past, p

Michiko Inoue, Xiaowei Li, Cheng Wen Wu

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.

Original language	English
Title of host publication	2019 IEEE International Test Conference, ITC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728148236
DOIs	https://doi.org/10.1109/ITC44170.2019.9000151
Publication status	Published - 2019 Nov
Event	2019 IEEE International Test Conference, ITC 2019 - Washington, United States Duration: 2019 Nov 9 → 2019 Nov 15

Publication series

Name	Proceedings - International Test Conference
Volume	2019-November
ISSN (Print)	1089-3539

Conference

Conference	2019 IEEE International Test Conference, ITC 2019
Country/Territory	United States
City	Washington
Period	19-11-09 → 19-11-15

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1109/ITC44170.2019.9000151

Cite this

@inproceedings{2b0f84e82f094e18ab1faa2c03d2ab98,

title = "Asian test symposium - Past, present and future - Past, p",

abstract = "The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.",

author = "Michiko Inoue and Xiaowei Li and Wu, {Cheng Wen}",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE International Test Conference, ITC 2019 ; Conference date: 09-11-2019 Through 15-11-2019",

year = "2019",

month = nov,

doi = "10.1109/ITC44170.2019.9000151",

language = "English",

series = "Proceedings - International Test Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2019 IEEE International Test Conference, ITC 2019",

address = "United States",

}

Inoue, M, Li, X & Wu, CW 2019, Asian test symposium - Past, present and future - Past, p. in 2019 IEEE International Test Conference, ITC 2019., 9000151, Proceedings - International Test Conference, vol. 2019-November, Institute of Electrical and Electronics Engineers Inc., 2019 IEEE International Test Conference, ITC 2019, Washington, United States, 19-11-09. https://doi.org/10.1109/ITC44170.2019.9000151

Asian test symposium - Past, present and future - Past, p. / Inoue, Michiko; Li, Xiaowei; Wu, Cheng Wen.

2019 IEEE International Test Conference, ITC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 9000151 (Proceedings - International Test Conference; Vol. 2019-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Asian test symposium - Past, present and future - Past, p

AU - Inoue, Michiko

AU - Li, Xiaowei

AU - Wu, Cheng Wen

PY - 2019/11

Y1 - 2019/11

N2 - The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.

AB - The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.

UR - http://www.scopus.com/inward/record.url?scp=85081558545&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85081558545&partnerID=8YFLogxK

U2 - 10.1109/ITC44170.2019.9000151

DO - 10.1109/ITC44170.2019.9000151

M3 - Conference contribution

AN - SCOPUS:85081558545

T3 - Proceedings - International Test Conference

BT - 2019 IEEE International Test Conference, ITC 2019

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2019 IEEE International Test Conference, ITC 2019

Y2 - 9 November 2019 through 15 November 2019

ER -

Asian test symposium - Past, present and future - Past, p

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All Science Journal Classification (ASJC) codes

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