TY - JOUR
T1 - Asymmetric external field effects on photoluminescence efficiency in a blue (In,Ga)N quantum-well diode with an additional n -type electron reservoir layer
AU - Fujiwara, Kenzo
AU - Katou, Hirofumi
AU - Inoue, Takao
AU - Sheu, Jin Kong
PY - 2009/7/1
Y1 - 2009/7/1
N2 - External field effects on photoluminescence (PL) spectra of a blue In0.3Ga0.7N multiple-quantum-well (MQW) diode with an additional n+-doped In0.18Ga0.82N electron reservoir layer (ERL) have been investigated at 20 K as a function of bias voltage under direct excitation conditions, where only the MQW and ERL regions are photoexcited. When the reverse bias is increased, the PL emission of MQW is strongly quenched, accompanying a blue-shift due to compensation of the internal piezo-fields, while the ERL emission is stable. However, the PL intensity of ERL is significantly decreased with increasing the forward field, showing asymmetric behaviors on the PL efficiency with respect to the field direction. These results indicate that field-induced escape processes of photogenerated electrons and holes from the excited regions play an important role for determination of the PL efficiency.
AB - External field effects on photoluminescence (PL) spectra of a blue In0.3Ga0.7N multiple-quantum-well (MQW) diode with an additional n+-doped In0.18Ga0.82N electron reservoir layer (ERL) have been investigated at 20 K as a function of bias voltage under direct excitation conditions, where only the MQW and ERL regions are photoexcited. When the reverse bias is increased, the PL emission of MQW is strongly quenched, accompanying a blue-shift due to compensation of the internal piezo-fields, while the ERL emission is stable. However, the PL intensity of ERL is significantly decreased with increasing the forward field, showing asymmetric behaviors on the PL efficiency with respect to the field direction. These results indicate that field-induced escape processes of photogenerated electrons and holes from the excited regions play an important role for determination of the PL efficiency.
UR - http://www.scopus.com/inward/record.url?scp=79251643466&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79251643466&partnerID=8YFLogxK
U2 - 10.1002/pssc.200880780
DO - 10.1002/pssc.200880780
M3 - Article
AN - SCOPUS:79251643466
SN - 1862-6351
VL - 6
SP - S687-S690
JO - Physica Status Solidi C: Conferences
JF - Physica Status Solidi C: Conferences
IS - SUPPL. 2
ER -