Automata Based Test Plans for Fault Diagnosis in Batch Processes

Chuei-Tin Chang, Wei Chung Hsieh

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Hardware failures are inevitable but random events in the useful life of any batch chemical plant. If such incidents are not efficiently diagnosed, the consequences may be very serious and sometimes even catastrophic. The present study aims to develop a systematic procedure-synthesis strategy for generating the test plans that minimize the chance of misjudgements. By modelling the components in the given system with timed automata, all possible fault propagation scenarios and their observable event traces (OETs) can be enumerated. The test procedure for every OET can then be conjectured by designing a supervisory controller to achieve the highest level of diagnostic resolution. One example is provided to show the feasibility of the proposed approach.

Original languageEnglish
Title of host publicationComputer Aided Chemical Engineering
PublisherElsevier B.V.
Pages1781-1786
Number of pages6
DOIs
Publication statusPublished - 2015 Jan 1

Publication series

NameComputer Aided Chemical Engineering
Volume37
ISSN (Print)1570-7946

Fingerprint

Chemical plants
Failure analysis
Hardware
Controllers

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Computer Science Applications

Cite this

Chang, C-T., & Hsieh, W. C. (2015). Automata Based Test Plans for Fault Diagnosis in Batch Processes. In Computer Aided Chemical Engineering (pp. 1781-1786). (Computer Aided Chemical Engineering; Vol. 37). Elsevier B.V.. https://doi.org/10.1016/B978-0-444-63577-8.50142-X
Chang, Chuei-Tin ; Hsieh, Wei Chung. / Automata Based Test Plans for Fault Diagnosis in Batch Processes. Computer Aided Chemical Engineering. Elsevier B.V., 2015. pp. 1781-1786 (Computer Aided Chemical Engineering).
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Chang, C-T & Hsieh, WC 2015, Automata Based Test Plans for Fault Diagnosis in Batch Processes. in Computer Aided Chemical Engineering. Computer Aided Chemical Engineering, vol. 37, Elsevier B.V., pp. 1781-1786. https://doi.org/10.1016/B978-0-444-63577-8.50142-X

Automata Based Test Plans for Fault Diagnosis in Batch Processes. / Chang, Chuei-Tin; Hsieh, Wei Chung.

Computer Aided Chemical Engineering. Elsevier B.V., 2015. p. 1781-1786 (Computer Aided Chemical Engineering; Vol. 37).

Research output: Chapter in Book/Report/Conference proceedingChapter

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Chang C-T, Hsieh WC. Automata Based Test Plans for Fault Diagnosis in Batch Processes. In Computer Aided Chemical Engineering. Elsevier B.V. 2015. p. 1781-1786. (Computer Aided Chemical Engineering). https://doi.org/10.1016/B978-0-444-63577-8.50142-X