Automated surface profile measurement of printed circuit boards by phase-shifted shadow moiré

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Phass-shifted shadow Moire has gained more applications in electronic industry. However, printed circuit boards (PCB) may contain many cavities or specular materials on the surface that make the phase-unwrapping of Moire fringe patterns more difficult or fail. In this paper, a method is proposed to overcome this difficulty to process the phase-shifted fringe patterns effectively and automatically for surface profile measurement. Firstly the intensity values of the original four phase-shifted fringe patterns are averaged and differentiated to enhance the erroneous spots. Then the median grey-level value of the enhanced image is used as the threshold to binarize the enhanced image to find the erroneous bright and black spots. According to the largest size of erroneous spot, the size of a structuring element is determined for morphology filtering. Thereafter the phase can be calculated and unwrapped correctly. Test of the method on a PCB is demonstrated and discussed.

Original languageEnglish
Title of host publicationAdvancement of Optical Methods in Experimental Mechanics - Conference Proceedings of the Society for Experimental Mechanics Series
Pages235-240
Number of pages6
DOIs
Publication statusPublished - 2014 Jan 1
Event2013 Annual Conference on Experimental and Applied Mechanics - Lombard, IL, United States
Duration: 2013 Jun 32013 Jun 5

Publication series

NameConference Proceedings of the Society for Experimental Mechanics Series
Volume3
ISSN (Print)2191-5644
ISSN (Electronic)2191-5652

Other

Other2013 Annual Conference on Experimental and Applied Mechanics
CountryUnited States
CityLombard, IL
Period13-06-0313-06-05

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Computational Mechanics
  • Mechanical Engineering

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