Automatic baseline-sample-selection scheme for baseline predictive maintenance

Chun Fang Chen; Yao Sheng Hsieh; Fan Tien Cheng; Hsien Cheng Huang; Saint Chi Wang

doi:10.1109/CoASE.2013.6653934

Automatic baseline-sample-selection scheme for baseline predictive maintenance

Chun Fang Chen, Yao Sheng Hsieh, Fan Tien Cheng, Hsien Cheng Huang, Saint Chi Wang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

A virtual-metrology-based (VM-based) baseline-predictive-maintenance (BPM) scheme was proposed by the authors recently. By applying the BPM scheme, fault diagnosis and prognosis can be accomplished and the requirement of massive historical failure data can also be released. The accuracy of the BPM scheme highly depends on the correctness of the baseline models in the BPM scheme. The samples of creating the target-device (TD) baseline model consist of the concise and healthy (C&H) historical samples and the fresh samples just after maintenance. Originally, each one of the C&H samples was checked manually to ensure that the sample was generated under healthy status and its data quality is good. However, this health-&-quality check process is so tedious and may also neglect deleting contradictory samples, which may deteriorate the BPM results and prohibit the usage of the BPM scheme. The purpose of this paper is to develop an automatic baseline-sample-selection (ABSS) scheme for selecting the C&H samples and deleting the contradictory samples automatically.

Original language	English
Title of host publication	2013 IEEE International Conference on Automation Science and Engineering, CASE 2013
Pages	183-188
Number of pages	6
DOIs	https://doi.org/10.1109/CoASE.2013.6653934
Publication status	Published - 2013 Dec 1
Event	2013 IEEE International Conference on Automation Science and Engineering, CASE 2013 - Madison, WI, United States Duration: 2013 Aug 17 → 2013 Aug 20

Publication series

Name	IEEE International Conference on Automation Science and Engineering
ISSN (Print)	2161-8070
ISSN (Electronic)	2161-8089

Other

Other	2013 IEEE International Conference on Automation Science and Engineering, CASE 2013
Country	United States
City	Madison, WI
Period	13-08-17 → 13-08-20

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/CoASE.2013.6653934

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Chen, C. F., Hsieh, Y. S., Cheng, F. T., Huang, H. C., & Wang, S. C. (2013). Automatic baseline-sample-selection scheme for baseline predictive maintenance. In 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013 (pp. 183-188). [6653934] (IEEE International Conference on Automation Science and Engineering). https://doi.org/10.1109/CoASE.2013.6653934

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title = "Automatic baseline-sample-selection scheme for baseline predictive maintenance",

abstract = "A virtual-metrology-based (VM-based) baseline-predictive-maintenance (BPM) scheme was proposed by the authors recently. By applying the BPM scheme, fault diagnosis and prognosis can be accomplished and the requirement of massive historical failure data can also be released. The accuracy of the BPM scheme highly depends on the correctness of the baseline models in the BPM scheme. The samples of creating the target-device (TD) baseline model consist of the concise and healthy (C&H) historical samples and the fresh samples just after maintenance. Originally, each one of the C&H samples was checked manually to ensure that the sample was generated under healthy status and its data quality is good. However, this health-&-quality check process is so tedious and may also neglect deleting contradictory samples, which may deteriorate the BPM results and prohibit the usage of the BPM scheme. The purpose of this paper is to develop an automatic baseline-sample-selection (ABSS) scheme for selecting the C&H samples and deleting the contradictory samples automatically.",

author = "Chen, {Chun Fang} and Hsieh, {Yao Sheng} and Cheng, {Fan Tien} and Huang, {Hsien Cheng} and Wang, {Saint Chi}",

year = "2013",

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doi = "10.1109/CoASE.2013.6653934",

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Chen, CF, Hsieh, YS , Cheng, FT , Huang, HC & Wang, SC 2013, Automatic baseline-sample-selection scheme for baseline predictive maintenance. in 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013., 6653934, IEEE International Conference on Automation Science and Engineering, pp. 183-188, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013, Madison, WI, United States, 13-08-17. https://doi.org/10.1109/CoASE.2013.6653934

Automatic baseline-sample-selection scheme for baseline predictive maintenance. / Chen, Chun Fang; Hsieh, Yao Sheng ; Cheng, Fan Tien ; Huang, Hsien Cheng; Wang, Saint Chi.

2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. 2013. p. 183-188 6653934 (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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