Automatic generation of Boundary Scan and BIST circuitry

F.-D. Guo, J.-H. Hong, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original languageEnglish
Title of host publication5th VLSI Design/CAD Symposium
Place of PublicationTainan
Pages251-256
Publication statusPublished - 1994 Aug

Cite this

Guo, F-D., Hong, J-H., & Wu, C-W. (1994). Automatic generation of Boundary Scan and BIST circuitry. In 5th VLSI Design/CAD Symposium (pp. 251-256).