Automatic generation of Boundary Scan and BIST circuitry

F.-D. Guo, J.-H. Hong, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication5th VLSI Design/CAD Symposium
Place of PublicationTainan
Pages251-256
Publication statusPublished - 1994 Aug

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