Automatic generation of memory built-in self-test cores for system-on-chip

Computer Science

• build-in self-test 100%
• System-on-Chip 100%
• Automatic Generation 100%
• Integration Test 40%
• Power Consumption 20%
• Test Generation 20%
• System on a Chip 20%
• Memory Architecture 20%
• Time Performance 20%
• embedded memory 20%
• System Integrator 20%
• Bus Interface 20%

Keyphrases

• Automatic Testing 33%
• Test Effort 33%
• Extensible Architecture 33%
• Heterogeneous Memory System 33%