Automatic optical inspection on mura defect of TFT-LCD

Shang-Liang Chen, J. W. Jhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Automatic optical inspection plays a key role in inspection of automations and equipments. It can replace manual inspect, reduce the production costs and achieve high speed and high precision with the inspection. Increasing the quality and efficiency of production materially. Mura defect automatic optical inspection system combines with electro-mechanical Systems, image acquisition systems and inspection software. In inspection software, it is to implement polynomial background surface estimation, use the standard which was defined by SEMI and apply auto-focus method to ensure the quality of image. This system has 100% accuracy and spent 45∼55 seconds in the experimental stage. There are two options can be selected, inline or off-line inspection.

Original languageEnglish
Title of host publicationProceedings of the 35th International MATADOR 2007 Conference
Pages233-236
Number of pages4
Publication statusPublished - 2007
Event35th International MATADOR 2007 Conference - Taipei, Taiwan
Duration: 2007 Jul 12007 Jul 1

Other

Other35th International MATADOR 2007 Conference
CountryTaiwan
CityTaipei
Period07-07-0107-07-01

Fingerprint

Liquid crystal displays
Inspection
Defects
Image acquisition
Automation
Polynomials
Costs

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials

Cite this

Chen, S-L., & Jhou, J. W. (2007). Automatic optical inspection on mura defect of TFT-LCD. In Proceedings of the 35th International MATADOR 2007 Conference (pp. 233-236)
Chen, Shang-Liang ; Jhou, J. W. / Automatic optical inspection on mura defect of TFT-LCD. Proceedings of the 35th International MATADOR 2007 Conference. 2007. pp. 233-236
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Chen, S-L & Jhou, JW 2007, Automatic optical inspection on mura defect of TFT-LCD. in Proceedings of the 35th International MATADOR 2007 Conference. pp. 233-236, 35th International MATADOR 2007 Conference, Taipei, Taiwan, 07-07-01.

Automatic optical inspection on mura defect of TFT-LCD. / Chen, Shang-Liang; Jhou, J. W.

Proceedings of the 35th International MATADOR 2007 Conference. 2007. p. 233-236.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Chen S-L, Jhou JW. Automatic optical inspection on mura defect of TFT-LCD. In Proceedings of the 35th International MATADOR 2007 Conference. 2007. p. 233-236